P‐73: Breakthrough for Production Test Cost Reduction on MicroLED Device with High Parallel Single Insertion Testing of Electric‐Luminescence and Electrical Tests

نویسندگان

چکیده

To launch up Micro‐LED display, the biggest challenge is cost reduction, With urgent needs to reduce test costs, most critical issues parallelizing electroluminescence (EL) test. In this paper, we propose super cost‐effective methods (PEMP TM ) embedding EL and electrical report its effectiveness application results.

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ژورنال

عنوان ژورنال: Sid's Digest Of Technical Papers

سال: 2023

ISSN: ['2154-6738', '2168-0159', '2154-6746', '0097-966X']

DOI: https://doi.org/10.1002/sdtp.16942